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You searched for: subject:"semiconductor manufacturing"
[texts]4Q Taiwanese Semiconductor Manufacturing Market Report
This research report presents shipment value forecast and recent quarter review of the Taiwanese semiconductor manufacturing industry. Companies surveyed in this research are those owning facilities to make MOS (Metal Oxide Semiconductor) wafers in Taiwan, including IC foundries, DRAM (Dynamic Random Access Memory) vendors, and IDM (Integrated Device Manufacture) companies. The content of this report is based on primary data obtained through interviews, and publicly available information such as...
Keywords: Taiwanese Semiconductor; Semiconductor Manufacturing Sector; Taiwanese Semiconductor industry
Downloads: 3
[movies]MIT OCW: 2.830J/6.780J/ESD.63J Control of Manufacturing Processes, Spring 2008 - Duane Boning, David Hardt
This course explores statistical modeling and control in manufacturing processes. Topics include the use of experimental design and response surface modeling to understand manufacturing process physics, as well as defect and parametric yield modeling and optimization. Various forms of process control, including statistical process control, run by run and adaptive control, and real-time feedback control, are covered...
Keywords: Process control; manufacturing process; discrete system feedback control theory; empirical and adaptive modeling; off-line optimization; statistical process control; real-time control; 2.830J; 2.830; one-factor-at-a-time; robustness; Shewhart Hypothesis; semiconductor manufacturing
Downloads: 1,522
[movies]MIT2-830JS08 - MIT OpenCourseWare
This course explores statistical modeling and control in manufacturing processes. Topics include the use of experimental design and response surface modeling to understand manufacturing process physics, as well as defect and parametric yield modeling and optimization. Various forms of process control, including statistical process control, run by run and adaptive control, and real-time feedback control, are covered...
Keywords: process control; manufacturing process; discrete system; feedback control theory; empirical; adaptive; modeling; off-line optimization; statistical process control; real-time control; 2.830J; 2.830; robustness; Shewhart Hypothesis; semiconductor manufacturing
Downloads: 13,157
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